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ICMTS 1998 : proceedings of the 1998 IEEE International Conference on Microelectronic Test Structures : March 23-26, 1998, Kanazawa, Japan / sponsored by the IEEE Electron Devices Society

データ種別	図書
出版者	[New York] : Institute of Electrical and Electronics Engineers
出版年	c1998
形態	x, 240 p. : ill. ; 30 cm
別書名	異なりアクセスタイトル:The 1998 International Conference on Microelectronic Test Structures
著者標目	*IEEE International Conference on Microelectronic Test Structures (1998 : Kanazawa-shi, Japan) IEEE Electron Devices Society Institute of Electrical and Electronics Engineers
件　名	LCSH:Integrated circuits -- Testing -- Congresses  全ての件名で検索 LCSH:Semiconductors -- Testing -- Congresses  全ての件名で検索 LCSH:Electronic apparatus and appliances -- Testing -- Congresses  全ての件名で検索
分　類	NDC:549.3
書誌ID	LT00571080

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