| 1 |
IDDQ testing of VLSI circuits / edited by Ravi K. Gulati and Charles F. Hawkins
Boston : Kluwer Academic , c1993
|
| 2 |
Multi-chip module test strategies / edited by Yervant Zorian
Boston : Kluwer Academic Pub. , c1997
|
| 3 |
10
Defect oriented testing for CMOS analog and digital circuits / by Manoj Sachdev
Boston, Mass. : Kluwer Academic Pub. , c1998
|
| 4 |
31
Data mining and diagnosing IC fails / Leendert M. Huisman
New York : Springer , c2005
|
| 5 |
32
Fault-tolerance techniques for SRAM-based FPGAs / by Fernanda Lima Kastensmidt, Luigi Carro and Ricardo Reis
: hb. - Dordrecht : Springer , c2006
|
| 6 |
34
Defect-oriented testing for nano-metric CMOS VLSI circuits / by Manoj Sachdev and José Pineda de Gyvez
2nd ed. - Dordrecht : Springer , c2007
|
| 7 |
36
Oscillation-based test in mixed-signal circuits / Gloria Huertas Sánchez ... [et al.]
Dordrecht : Springer , c2006
|
| 8 |
v. 41
Soft errors in modern electronic systems / Michael Nicolaidis, editor
cased. - New York : Springer , c2011
|
