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Metrology of optoelectronic systems : 21-22 May 1987, Orlando, Florida / Edward M. Granger, chair/editor ; sponsored by SPIE, the International Society for Optical Engineering ; cooperating organizations, Center for Applied Optics/University of Alabama in Huntsville ... [et al.]
(Proceedings of SPIE, the International Society for Optical Engineering ; v. 776)

データ種別	図書
出版者	Bellingham, Wash. : SPIE
出版年	c1987
形態	vi, 123 p. : ill. ; 28 cm
著者標目	Granger, Edward M. Society of Photo-optical Instrumentation Engineers University of Alabama in Huntsville. Center for Applies Optics
件　名	FREE:Optoelectronic devices -- Measurement -- Congresses  全ての件名で検索
分　類	NDC:549
書誌ID	LT00279542

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