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Characterization of crystal growth defects by X-ray methods : [proceedings of NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-ray Methods, held August 29-September 10, 1979, at Durham University, Durham, United Kingdom] / edited by Brian K. Tanner and D. Keith Bowen
(NATO advanced study institutes series ; ser. B . Physics ; v. 63)

データ種別	図書
出版者	New York : Plenum Press
出版年	c1980
形態	xxvi, 589 p. : ill. ; 26 cm
著者標目	*NATO Advanced Study Institute on Characterization of Crystal Growth Defects by X-Ray Methods (1979 : Durham, Durham) Tanner, B. K. (Brian Keith) Bowen, D. Keith (David Keith), 1940-
件　名	LCSH:Crystals -- Defects -- Congresses  全ての件名で検索 LCSH:X-ray crystallography -- Congresses  全ての件名で検索
分　類	NDC:459.97
書誌ID	LT00210379

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